DAIS Lab > Publications > Patents

2018

1. Patent
   Model-plant mismatch detection using model parameter data clustering for paper machines or other systems
   Qiugang Lu, Bhushan Gopaluni, Michael Forbes, Johan Backstrom, Guy A. Dumont, Philip Loewen
   US Patent App. 15. 2018
2. Patent
   Model-plant mismatch detection with support vector machine for cross-directional process behavior monitoring
   Qiugang Lu, R. Bhushan Gopaluni, Michael Forbes, Philip Loewen, Johan Backstrom, Guy A. Dumont
   US Patent App. 15. 2018
3. Patent
   Closed-loop model parameter identification techniques for industrial model-based process controllers
   Q Lu, LD Rippon, R. Bhushan Gopaluni, MG Forbes, PD Loewen, JU Backstrom, Guy A. Dumont
   US Patent App. 15. 2018

2017

4. Patent
   Optimal closed-loop input design for identification of flat sheet process models
   Qiugang Lu, R. Bhushan Gopaluni, Michael Forbes, PD Loewen, JU Backstrom, Guy A. Dumont
   US Patent App. 15. 2017