DAIS Lab > Publications > Patents


    2018
  1. Patent
    Model-plant mismatch detection using model parameter data clustering for paper machines or other systems
    Qiugang Lu, Bhushan Gopaluni, Michael Forbes, Johan Backstrom, Guy A. Dumont, Philip Loewen
    US Patent App. 15. 2018
  2. Patent
    Model-plant mismatch detection with support vector machine for cross-directional process behavior monitoring
    Qiugang Lu, R. Bhushan Gopaluni, Michael Forbes, Philip Loewen, Johan Backstrom, Guy A. Dumont
    US Patent App. 15. 2018
  3. Patent
    Closed-loop model parameter identification techniques for industrial model-based process controllers
    Q Lu, LD Rippon, R. Bhushan Gopaluni, MG Forbes, PD Loewen, JU Backstrom, Guy A. Dumont
    US Patent App. 15. 2018
  4. 2017
  5. Patent
    Optimal closed-loop input design for identification of flat sheet process models
    Qiugang Lu, R. Bhushan Gopaluni, Michael Forbes, PD Loewen, JU Backstrom, Guy A. Dumont
    US Patent App. 15. 2017

News


See more

Recruitment

Our group is recruiting year-round for postdocs, MASc and PhD students, visiting students and undergraduate students.

All admitted students will receive a stipend.

If you're interested in pursuing research or graduate studies, please email a copy of your

(1) CV, and
(2) Research Statement